產(chǎn)品信息
Products
產(chǎn)品信息
低溫恒溫器
For Photoluminescence Measurement
特征
自由控制樣本和溫度
以往的光致發(fā)光解析測定，只有將硅(Si)和砷化鎵(GaAs)等樣本固定在一定溫度才能進行測定，而使用本極低溫冷卻設備，可以讓樣本從室溫到極低溫范圍，保持冷卻狀態(tài)在X?Y?Z軸方向移動測定。
標準規(guī)格
| Model | CRT-A020-S200 | CRT-C020-S200 | CRT-C010-S200 |
| Cryocooler/Compressor | HE05/UW404 | D510/SW115 | D105／SW112 |
| Ultimate Temperature | 4K | 12K | 12K |
| Temperature Controllable Range | 4K to 300K ±0.2K | 12K to 300K ±0.2K | 12K to 300K ±0.2K |
| Optical Window Dimensions | Light Inlet : φ20（mm）, Photoluminescence : φ30（mm）, Reflected Light : φ20（mm） | ||
| Sample Dimensions | 10×10×1t（mm） | ||
| Number of Samples | 3 | ||
| Accessories | Evacuation valve, Heater for temperature control, XYZ Table , Cryogenic thermometer (for temperature control / measurement), Coldhead Accessories rotation system |
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*It may vary depending on the operating condition.
CRYOSTAT For Photoluminescence Measurement[PDF:308KB]
